A. di Pasquo, E. Monaco, C. Nani and L. Fanucci, "Delay-lines jitter modeling and efficiency analysis in FinFET technology," 2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS), 2021, pp. 1-5, doi: 10.1109/ICECS53924
Written by ALESSIO DI PASQUO
Published in
Elenco Pubblicazioni - Publications
