Foto 7

A. Catania, S. Strangio, M. Paliy, C. Sbrana, M. Bertozzi and G. Iannaccone, "High-Entropy Analog-Based Strong PUF Reaching 166 F2/Bit Area-to-Entropy-Ratio," 2025 IEEE Custom Integrated Circuits Conference (CICC), Boston, MA, USA, 2025, pp. 1-3

Written by